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The Fine Resolution Explorer for Salinity, Carbon and Hydrology (FRESCH): A Satellite Mission to Study Ocean-Land-Ice Interfaces. In: IGARSS 2024 - 2024 IEEE International Geoscience and Remote Sensing Symposium

  • Nemesio Rodríguez-Fernández
  • Tim Rixen
  • Jacqueline Boutin
  • Peter Brandt
  • Chiara Corbari
  • Maria José Escorihuela
  • Marine Herrmann
  • Doroteaciro Iovino
  • Peter Landschützer
  • Ioanna Merkouriadi
  • Alexandre Roy
  • Marko Scholze
  • Yann Kerr
  • Eric Anterrieu
  • Louise Yu
  • Alain Lamy
  • Patrice Gonzalez
  • Francesca Scala
  • Camila Colombo
  • Gabriella Gaias
  • Antonio Gutierrez
  • Gonçalo Lopes
  • Alexandre Mège
  • Asma Kallel
  • Benjamin Carayon
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Abstract

The Fine Resolution Explorer for Salinity, Carbon and Hydrology (FRESCH) is presented. The science case and the mission objectives are discussed before presenting the mission concept. FRESCH is an L-band antenna array operated in beamforming mode providing data at a spatial resolution of 10-15 km to study the biogeochemical and physical phenomena taking place at the interfaces of ocean, land and ice. FRESCH has been submitted to the European Space Agency Earth Explorer 12 program.

Cite this activity

Rodríguez-Fernández N., Rixen T., Boutin J., Brandt P., Corbari C., Escorihuela M.J., Herrmann M., Iovino D., Landschützer P., Merkouriadi I., Roy A., Scholze M., Kerr Y., Anterrieu E., Yu L., Lamy A., Gonzalez P., Scala F., Colombo C., Gaias G., Gutierrez A., Lopes G., Mège A., Kallel A. and Carayon B. (2024) The Fine Resolution Explorer for Salinity, Carbon and Hydrology (FRESCH): A Satellite Mission to Study Ocean-Land-Ice Interfaces. In: The Institute of Electrical and Electronics Engineers, Inc. (ed.). IGARSS 2024 - 2024 IEEE International Geoscience and Remote Sensing Symposium (pp. 6705-6708). 10.1109/IGARSS53475.2024.10641846

Details

Research topics
Date 05.09.2024
Pages 6705-6708
Book Title IGARSS 2024 - 2024 IEEE International Geoscience and Remote Sensing Symposium
Editors The Institute of Electrical and Electronics Engineers, Inc.
ISBN 979-8-3503-6033-2
Open Access Closed Access
Open Access Status Closed Access
Eprints_link https://cris.leibniz-zmt.de/id/eprint/6146

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